It is important to account for the wave nature of light, which causes
the throughput of optical systems to differ from what geometrical
optics predicts. A practical method to account for the wave nature of
light is Kirchhoff’s theory of diffraction, particularly its
Fresnel/paraxial version. In this context, one may refer to
deviations from the throughput expected based on geometrical optics
as diffraction effects. As a rule, the longer the wavelength, the
more severe are the diffraction effects. Hence, diffraction effects
are especially pronounced in the important far-infrared region of the
spectrum, and accounting for them can be an indispensable component
of accurate measurements.
To illustrate the effects of the wave nature of light, and our abilities
to simulate it, consider the optical layout illustrated schematically in
Figure 1a. A point source illuminates an 11.6 mm diameter
detector through two 6.1844 mm diameter apertures placed in series
in front of the detector with two 650 mm spaces between optics. The
point source is off-axis by 0.229 degrees.
Figure 1a
Figures 1b-1d illustrate the diffraction ring
patterns that would appear in the detector plane for 2 µm radiation.
Figure 1b illustrates the pattern for only the furthest
aperture (A) being present, while Figure 1c illustrates the
pattern for only the closer aperture (B) being present. One can
routinely calculate these ring patterns by using Lommel’s
treatment. Figure 1d illustrates the pattern that would occur with
both apertures present. In the Figures, the large (yellow) circle
indicates the detector perimeter, whereas the smaller green circles
indicate the geometrical shadow boundaries of the apertures. In
geometrical optics, one would have uniform illumination within the
interiors of the green circles or their intersection. Because of
diffraction, the illumination is not uniform, varying between being
lighter and darker than what is expected geometrically, and some
radiation also falls in geometrical shadow regions.
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| Figure 1b |
Figure 1c |
Figure 1d |
The topic of diffraction correction in
radiometry is reviewed in Chapter 9 of Optical Radiometry,
and several of our contributions to the diffraction literature in the
context of radiometry are listed below.
References
- Diffraction Effects in Radiometry,
Shirley, E.L.,
in Optical Radiometry, Experimental Methods in The Physical
Sciences, Vol. 41, Chapter 9, pp. 409-451,
ed. by A.C. Parr, R.U. Datla, and J.L. Gardner (Academic Press, 2005).
- Diffraction
corrections in radiometry: spectral and total power and asymptotic
properties,
Shirley, E.L.,
J. Opt. Soc. Am. A 21, 1895-906 (2004).
- Diffraction
effects on broadband radiation: formulation for computing total
irradiance,
Shirley, E.L.,
Appl. Opt. 43, 2609-2620 (2004).
- Intuitive
diffraction model for multistaged optical systems,
Shirley, E.L.,
Appl. Opt. 43, 735-743 (2004).
- Fraunhofer
diffraction effects on total power for a Planckian source,
Shirley, E.L.,
J. Res. Natl. Inst. Stand. Technol. 106, 775-779 (2001).
- Revised
formulas for diffraction effects with point and extended sources,
Shirley, E.L.,
Appl. Opt. 37, 6581-6590 (1998).
- Optimally
Toothed Apertures for Reduced Diffraction,
Shirley, E.L. and Datla, R.U.,
J. Res. Natl. Inst. Stand. Technol. 101, 745-753 (1996).
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