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August 29- September 1, 2000 
2000 NIST Photometry Course Participants at the NIST entrance. The Optical Technology Division of NIST hosted the third NIST Photometry Short Course from August 29 to September 1, 2000 at NIST, Gaithersburg. We had 27 participants - one and half times more participants this time than previous years. This year, we introduced the lecture-only registration (two days) as well as the full registration that included laboratory sessions (three and half days). We had 9 lecture-only participants and 18 full registration participants. The full registration had to be limited to 18 people as previous years due to limitation in the laboratory sessions but late applicants had an option to register for lectures only. This year's Course comprised 12 lectures, a 3 hour laboratory tour of NIST labs, and three laboratory sessions for a day and half. Dr. Georg Sauter from PTB, Germany, joined us again as the special invited lecturer. Lectures were given by Dr. Sauter as well as the NIST scientists - Yoshi Ohno, Steve Brown, Cameron Miller, Yuqin Zong, and Sally Bruce. The subjects of the lectures included basic concepts in photometry, fundamentals of photometry and colorimetry, measurements of luminous intensity, illuminance, luminous flux, luminance, goniophotometry, colorimetry of light sources, quality system, and uncertainty evaluation. We also had a new lecture - Applied Photometry on measurements of flashing lights and LEDs, and a new interactive session on Uncertainty Calculation. The laboratory sessions were carried out using our 4 m photometry bench, the 2.5 m integrating sphere, and a color measurement setup, where the participants, divided into three groups, had hands-on experiences. We received favorable responses from the participants, and found that this year's Course was successful again.
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