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 2001 NIST Photometry Course Participants at the NIST entrance. The Optical Technology Division of NIST hosted the fourth NIST Photometry Short Course from August 28 to 31, 2001 at NIST, Gaithersburg. We had a total of 30 participants, 12 lecture-only participants and 18 full registration participants. The full registration had to be limited to 18 people as previous years due to limitation in the laboratory sessions. This year's Course comprised 12 lectures, a 3 hour laboratory tour of NIST labs, and three laboratory sessions for a day and half. Dr. Georg Sauter from PTB, Germany, joined us again as the special invited lecturer and a laboratory session teacher. Lectures were given by Dr. Sauter as well as the NIST scientists - Yoshi Ohno, Steve Brown, Cameron Miller, and Sally Bruce. The subjects of the lectures included basic concepts in photometry, fundamentals of photometry and colorimetry, measurements of luminous intensity, illuminance, luminous flux, luminance, goniophotometry, colorimetry of light sources, quality system, and uncertainty evaluation. We also had a new lecture - Applied Photometry on measurements of flashing lights and LEDs, and a new interactive session on Uncertainty Calculation. The laboratory sessions were carried out using our 4 m photometry bench, the 2.5 m integrating sphere, and a color measurement setup, where the participants, divided into three groups, had hands-on experiences. We received favorable responses from the participants, and found that this year's Course was successful again.
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