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2002 NIST Photometry Short Course September 24 - 27, 2002  2002 NIST Photometry Course Participants at the NIST entrance. The Optical Technology Division of NIST hosted the fifth NIST Photometry Short Course from September 24 to 27, 2002 at NIST, Gaithersburg. We had a total of 28 participants, 10 lecture-only participants and 18 full registration participants. The full registration had to be limited to 18 people as previous years due to limitation in the laboratory sessions. This year's Course comprised 12 lectures, a 3 hour laboratory tour of NIST labs, and three laboratory sessions for a day and half. Dr. Georg Sauter from PTB, Germany, and Dr. Jim Gardner from CSIRO, Australia joined us as the special invited lecturer. Lectures were given by Dr. Sauter and Dr. Gardner as well as the NIST scientists - Yoshi Ohno, Steve Brown, Cameron Miller, and Sally Bruce. The subjects of the lectures included basic concepts in photometry, fundamentals of photometry and colorimetry, measurements of luminous intensity, illuminance, luminous flux, luminance, goniophotometry, colorimetry of light sources, quality system, and uncertainty evaluation. We also had a new lecture - Applied Photometry on measurements of LEDs, and an interactive session on Uncertainty Calculation. The laboratory sessions were carried out using our 4 m photometry bench, the 2.5 m integrating sphere, and a color measurement setup, where the participants, divided into three groups, had hands-on experiences. We received favorable responses from the participants, and found that this year's Course was successful again.
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