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2003 NIST Photometry Short Course September 23 - 26, 2003  2003 NIST Photometry Course Participants at the NIST entrance. |
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The Optical Technology Division of NIST hosted the fifth NIST Photometry Short
Course from September 23 to 26, 2003 at NIST, Gaithersburg. We had a total
of 24 participants, 6 lecture-only participants and 18 full
registration participants. The full registration had to be limited to
18 people as previous years due to limitation in the laboratory sessions.
This year's Course comprised 12 lectures, a 3 hour laboratory tour of
NIST labs, and three laboratory sessions for a day and half. Dr. Georg
Sauter from PTB, Germany joined us as the special invited lecturer. Lectures
were given by Dr. Sauter as well as the NIST scientists - Yoshi Ohno,
Steve Brown, Cameron Miller, Yuqin Zong and Sally Bruce. The subjects of the
lectures included basic concepts in photometry, fundamentals of photometry and
colorimetry, measurements of luminous intensity, illuminance, luminous flux,
luminance, goniophotometry, colorimetry of light sources, quality system, and
uncertainty evaluation. The laboratory sessions were carried out using our
4 m photometry bench, the 2.5 m integrating sphere, and a color
measurement setup, where the participants, divided into three groups, had
hands-on experiences. We received favorable responses from the participants,
and found that this year's Course was successful again. Records: Photographs:
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