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Optical Technology Division Activities at
Synchrotron Ultraviolet Radiation Facility (SURF III)


SURF III logo (5K gif) Blackbody radiation and synchrotron radiation are the only two known sources of absolutely calculable radiation. Knowledge of a few simple parameters (thermodynamic temperature and spectral emissivity for a blackbody; storage ring electron energy, magnetic field and circulating current for synchrotron radiation) completely determine the spectral and spatial distribution of radiation emitted by these sources, making them suitable as absolute radiometric standards.

In the UV and even shorter wavelength regions, synchrotron radiation stands out as the only standard source available to date since this wavelength region is out of reach to the widely used blackbody source standard. Figure 1 below compares the spectral radiance of a typical low-energy synchrotron radiation machine such as SURF III at a typical 200 mA storage ring current to 1000 K and 3000 K thermal sources. Synchrotron radiation is much brighter - and has an enormously greater useful spectral range - than any practical blackbody source.

SURF and blackbody radiance (7.4K gif)
Figure 1. SURF (200 mA beam current) and blackbody radiance
    As most of the modern synchrotron radiation machines are competing with each other in the soft to hard x-ray spectral range, SURF III is unique in that it is one of the few low electron-energy machines in the world that is dedicated to UV radiometry. It has a text-book style circular electron beam orbit with the energy of the electron beam operated anywhere between 10 MeV to 380 MeV. Such low electron energy machine is ideal for UV work because of the dramatically reduced damaging x-ray radiation associated with typical modern synchrotron radiation. The design of SURF III ensures that all the fundamental parameters can be measured with highest accuracy and, therefore, makes the radiation from SURF III a broad-band absolute national standard. In addition, the relatively small size of SURF III provides great flexibility for its users in terms of scheduling and the condition of operation.


The low absolute uncertainties in SURF III as a radiometric source permit substantial improvements in the NIST scales of spectral radiance and irradiance, especially in the ultraviolet and infrared spectral regions where existing source-based and detector-based standards have relatively large uncertainties. SURF III also permit unification of disparate scales scattered across the spectrum based on different sources and technologies.

Figure 2 summarizes some of the radiometric applications of SURF III. Particularly important in SURF III is the substantial improvements in ultraviolet radiometry in support of such diverse and critically important applications as standards for accurate long term monitoring of solar ultraviolet radiation, and improved standards, sources and detectors for control of UV curing and semiconductor lithography (continually moving to shorter wavelengths to reduce feature size). While the principal goal of SURF III is to improve the radiometric accuracy of the source, an additional benefit is the operation at higher electron energy of 380 MeV, resulting in dramatic soft x-ray flux increases, including the biologically important water window (water is transparent in the 2.3 nm to 4.4 nm spectral range) for use in x-ray microscopy.     SURF III radiometric applications (9.3K gif)
Figure 2. SURF III radiometric applications


The Optical Technology Division, in collaboration with the Electron and Optical Physics Division, operates two radiometric beamlines, beamline 3 and beamline 4, at SURF III. Beamline 3 is a national source standard based on synchrotron radiation whereas beamline 4 is a detector-based calibration facility with its primary scale derived from a helium-cooled cryogenic radiometer.

Beamline 3, or the Facility for Irradiance Calibration Using Synchrotrons (FICUS), is a white light beamline which directs the calculable SURF III radiation to the user station with minimum obstruction from optical components for spectral irradiance calibration of user sources such as deuterium lamps. Calibration of sources directly against SURF III yield results with much reduced measurement uncertainty. In the case of deuterium lamps, which are commonly used in industry as a transfer standard, we achieved an uncertainty of 1.2% (k=2) from 200 nm to 400 nm. In response to requests from industry, the beamline is currently undergoing upgrade to extend the spectral range to vacuum UV and further reduce the uncertainty.

Figure 3

Synchrotron radiation from beamline 3 for irradiance calibration.


Beamline 4 is a general purpose radiometric beamline consists of a 2 m monochromator to disperse radiation from SURF III. An Absolute Cryogenic Radiometer (ACR) at the end of the beamline accurately determines the radiant flux of the dispersed beam which, in turn, is used to calibrate the response of photodetectors. We have achieved an uncertainty of less than 1% (k=2) from 135 nm to 325 nm in measuring the spectral response of a typical silicon detector. In addition to detector power response calibration, the flexible design of the beamline enables a wide range of measurements such as reflectivity, internal quantum efficient, irradiance responsivity and radiation degradation of photodetectors as well as reflectivity and transmission of optical materials. Such works allow us to understand and model the behavior of various solid-state photodetectors and resulted in great impact on accurate UV detection for industries such as UV curing and semiconductor photolithography.

Photo of group working in the SURF facility

Photograph of SURF III beamlines.

References

  • "Stability of photodiodes under irradiation with 157 nm pulsed excimer laser," P.S. Shaw, R. Gupta, and K.R. Lykke, Appl. Opt. 44, 197-207 (2005).

  • "Damage to solid-state photodiodes by vacuum ultraviolet radiation," U. Arp, P.S. Shaw, R. Gupta, and K.R. Lykke, J. Electron. Spectrosc. Relat. Phenom. 144-147 (2005) 1039.

  • "Forty years of metrology with synchrotron radiation at SURF," U. Arp, A.P. Farrell, M.L. Furst, S. Grantham, E. Hagley, S.G. Kaplan, P.S. Shaw, C.S. Tarrio, and R.E. Vest, Synchrotron Radiat. News 15(5), 30 (2003).

  • "A SURF beamline for synchrotron source-based absolute radiometry," P.S. Shaw, U. Arp, H.W. Yoon, R.D. Saunders, A.C. Parr, and K.R. Lykke, Metrologia 40, S124-127 (2003).

  • "Characterization of an UV and VUV irradiance meter with synchrotron radiation," P.S. Shaw, R. Gupta, and K.R. Lykke, Appl. Opt. 41, 7173 (2002).

  • "The new beamline 3 at SURF III for source-based radiometry," P.S. Shaw, D. Shear, R.J. Stamilio, U. Arp, H.W. Yoon, R.D. Saunders, A.C. Parr, and K.R. Lykke, Rev. Sci. Instrum. 73, 1576 (2002).

  • "Characterization of UV detectors at SURF III," P.S. Shaw, T.C. Larason, R. Gupta, and Keith R. Lykke, Rev. Sci. Instrum. 73, 1625 (2002).

  • "The new ultraviolet spectral responsivity scale based on cryogenic radiometry at Synchrotron Ultraviolet Radiation Facility III," P.S. Shaw, T.C. Larason, R. Gupta, S.W. Brown, R.E. Vest, and K.R. Lykke, Rev. Sci. Instrum. 72, 2242, (2001).

  • "SURF III - An improved storage ring for radiometry," U. Arp, R. Friedman, M.L. Furst, S. Makar, and P.S. Shaw, Metrologia, 37, 357 (2000).

  • "Characterization of Materials using UV radiometric beamline at SURF III," P.S. Shaw, R. Gupta, T.A. Germer, U. Arp, T. Lucatorto, and K.R. Lykke, Metrologia, 37, 551 (2000).

  • "UV radiometry using synchrotron radiation and absolute cryogenic radiometer," P.S. Shaw, K.R. Lykke, R. Gupta, T.R. O’Brian, U. Arp, H.H. Hunter, T.B. Lucatorto, J.L. Dehmer, and A.C. Parr, Appl. Opt. 38, 18 (1999).

  • "New UV radiometry beamline at the synchrotron ultraviolet radiation facility at NIST," P.S. Shaw, K.R. Lykke, R. Gupta, T.R. O’Brian, U. Arp, H.H. Hunter, T.B. Lucatorto, J.L. Dehmer, and A.C. Parr, Metrologia, 35, 301 (1998).



For technical information or questions, call:
 
Ping-Shine Shaw
Phone: (301) 975-4416
FAX: (301) 208-6937
Email: shaw@nist.gov
      Keith Lykke
Phone: (301) 975-3216
FAX: (301) 208-6937
Email: lykke@nist.gov

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Online: September 1997   -   Last updated: January 2006