Recent Publications by Adriaan Carter

Low-Background Temperature Calibration of Infrared Blackbodies,

A.C. Carter, R.V. Datla, T.M. Jung, A.W. Smith, and J.A. Fedchak,

Metrologia 43, S46-S50 (2006).

ACR II: Improved Absolute Cryogenic Radiometer for Low Background Infrared Calibrations,

A.C. Carter, S.R. Lorentz, T.M. Jung, and R.V. Datla,

Appl. Opt. 44 871 (2005).

Improved Broadband Blackbody Calibrations at NIST for Low-Background Infrared Applications,

A.C. Carter, S.R. Lorentz, T.M. Jung, A.W. Smith, S.R. Lorentz, and R.V. Datla,

Metrologia 40, S1 (2003).

NIST Facility for Spectral Calibration of Detectors: Calibration of Arsenic Doped Silicon Blocked Impurity Band Detectors

A.C. Carter, S.R. Lorentz, T.M. Jung, B.J. Klemme, and R.V. Datla,

in Infrared Detectors and Focal Plane Arrays VI, ed. by E.L. Dereniak and R.E. Sampson, Proc. SPIE 4028, 420 (2000).

NIST-BMDO Transfer Radiometer (BXR)

T.M. Jung, A.C. Carter, S.R. Lorentz, and R.V. Datla,

in Infrared Detectors and Focal Plane Arrays VI, ed. by E.L. Dereniak and R.E. Sampson, Proc. SPIE 4028, 404 (2000).

A 1 cm Collimated Source for use in Infrared Calibrations

B.J. Klemme, T.M. Jung, A.C. Carter, E.L. Shirley, S.R. Lorentz, and R.V. Datla,

in Infrared Detectors and Focal Plane Arrays VI, ed. by E.L. Dereniak and R.E. Sampson, Proc. SPIE 4028, 411 (2000).

Microwave properties of Sr_0.5Ba_0.5TiO₃ thin-film ferroelectric interdigitated capacitors,

S.W. Kirchoefer, J.M. Pond, A.C. Carter, W. Chang, K.K. Agarwal, J.S. Horwitz, and D.B. Chrisey,

Appl. Phys. Lett. 74, 1033 (1999).

High-resolution scanning optical microscopy of ferroelectric thin films,

J. Levy, C. Hubert, A.C. Carter, W. Chang, S.W. Kirchoefer, J.S. Horwitz, and D.B. Chrisey,

Ferroelectrics 222, 181 (1999).

Micron Thick Epitaxial (100) Ag Film Growth on (100) MgO,

A.C. Carter, S.B. Qadri, W. Chang, J.S. Horwtiz, and D.B. Chrisey,

J. Mater. Res. 13, 1418 (1998).

Microwave properties of Sr_0.5Ba_0.5TiO₃ thin-film ferroelectric capacitors,

S.W. Kirchoefer, J. M. Pond, A.C. Carter, W. Chang, K.K. Agarwal, J.S. Horwitz, and D.B. Chrisey,

Microwave Opt. Technol. Lett. 18, 168-71 (1998).

High-resolution optical microscopy of Ba_xSr_1-xTiO₃ films,

C. Hubert, J. Levy, A.C. Carter, W. Chang, J.M. Pond, J.S. Horwitz, and D.B. Chrisey,

in Symp. Ferroelectric Thin Films VI, ed. by R.E. Treece, R.E. Jones, C.M. Foster, S.B. Desu, and I.K. Yoo (1998), p. 69-74.

Pulsed laser deposition of (Ba,Sr)TiO3 ferroelectric thin films,

J.S. Horwitz, W. Chang, A.C. Carter, J.M. Pond, S.W. Kirchoefer, D.B. Chrisey, R.M. Stroud, J. Levy, and C. Hubert,

in Advances in Laser Ablation of Materials, ed. by R.K. Singh, D.H. Lowndes, D.B. Chrisey, E. Fogarassy, and J. Narayan, 163-73 (1998).

Structure/Property relations in ferroelectric thin films for frequency agile microwave electronics,

J.S. Horwitz, W. Chang, A.C. Carter, J.M. Pond, S.W. Kirchoefer, D.B. Chrisey, J. Levy, and C. Hubert,

Integrated Ferroelectrics 22, 279-89 (1998).

Pulsed laser deposition as a materials research tool,

J.S. Horwitz, D.B. Chrisey, R.M. Stroud, A.C. Carter, J. Kim, W. Chang, J.M. Pond, S.W. Kirchoefer, M.S. Osofsky, and D. Koller,

Appl. Surf. Sci. 127-129, 507-12 (1998).

Pulsed Laser Deposition of Ferroelectric Thin Films for Room Temperature Active Microwave Electronics,

A.C. Carter, J.S. Horwitz, D.B. Chrisey, J.M. Pond, S.W. Kirchoefer, and W. Chang,

in Proc. 1997 Int'l Symp. Integrated Ferroelectrics (2-5 March 1997, Santa Fe.)

Confocal scanning optical microscopy of Ba_xSr_1-xTiO₃ thin films,

C. Hubert, J. Levy, A.C. Carter, W. Chang, S.W. Kirchoefer, J.S. Horwitz, and D.B. Chrisey,

Appl. Phys. Lett. 71, 3353 (1997).

Pulsed laser deposition of ferroelectric thin films for active microwave electronic devices,

J.S. Horwitz, D.B. Chrisey, A.C. Carter, W. Chang, L.A. Knauss, J.M. Pond, S.W. Kirchoefer, D. Korn, and S.B. Qadri,,

SPIE 2991, 238-46 (1997).

Surface Structure of Cadmium Selenide Nanocrystallites as Determined by EXAFS, FTIR and Elemental Analysis,

A.C. Carter, C.E. Bouldin, S.M. Majetich, K. Kemner, and M.I. Bell,

Phys. Rev. B 55, 13822 (1997).

Quantitative Study of Surface Binding to CdSe Nanocrystallites by NMR,

S.M. Majetich, A.C. Carter, R.D. McCullough, and J.A. Belot,

J. Phys. Chem. 98, 13705 (1994).

Surface Effects on the Optical Properties of Cadmium Selenide Quantum Dots,

S.A. Majetich and A.C. Carter,

J. Phys. Chem. 97, 8727 (1993).

Connected Cadmium Selenide Nanocrystallite Networks,

S.A. Majetich, A.C. Carter, and R.D. McCullough,

in Nanophase and Nanocomposite Materials, ed. by S. Komarneni, J.C. Parker, and G.J. Thomas, Materials Research Society Symp. Proc. 286, 87 (1993).

Surface Effects on the Properties of Cadmium Selenide Quantum Dots,

A.C. Carter and S.A. Majetich,

in Nanophase and Nanocomposite Materials, ed. by S. Komarneni, J.C. Parker, and G.J. Thomas, Materials Research Society Symp. Proc. 286, 81 (1993) (poster by A. Carter).

Connected CdSe Nanocrystallite Networks,

S.A. Majetich, A.C. Carter, R.D. McCullough, J. Seth, and J.A. Belot,

Zeitschrift fur Physik D. 26, 210 (1993).

Third Order Optical Nonlinearities of Soluble Polythiophenes,

H. Sasabe et al, A.C. Carter,

Nonlinear Opt. 3, 169 (1992).

Silicon Photodiode Detectors for EXAFS,

C.E. Bouldin, A.C. Carter, J. Kirkland, and R. Neiser,

Phys. B 158, 339 (1989).