Publications by Yoshiro Ohno Obtaining publications Search for "Ohno" in Physics Laboratory Annual Report Publications List Y. Ohno and R. Bergman, Detector-referenced integrating sphere photometry for industry", Proc., IESNA Annual Conference, August 2002, Salt Lake City, UT (2002). J. Hovila, P. Toivanen, E. Ikonen, and Y. Ohno, Intercomparison of the illuminance responsivity scales and units of luminous flux maintained at the HUT (Finland) and the NIST (USA), Metrologia, 39, 219-223 (2002). S. Brown and Y. Ohno, Color by Numbers, SPIE’s OE Magazine, 48, February 2002. Y. Ohno and B. Kránicz, Spectroradiometer Characterization for Colorimetry of LEDs, Proc. 2nd CIE Expert Symposium on LED Measurement, May 11-12, 2001, Gaithersburg, Maryland, USA, 56-60 (2001). Y. Ohno, A Numerical Method for Color Uncertainty, Proc. CIE Expert Symposium 2001 on Uncertainty Evaluation, Jan. 2001, Vienna, Austria, 8-11 (2001). Y. Ohno, and S. W. Brown, "Photometry, Sensing Light and Color", Optics and Photonics News, September 2001, 12(9), 38-40 (2001). Y. Ohno and R. O. Daubach, "Integrating Sphere Simulation on Spatial Nonuniformity Errors in Luminous Flux Measurement", J. IES, 30(1), 105-115 (2001). Y. Ohno, Chapter 14, Photometry and Radiometry - Review for Vision Optics, Part 2 Vision Optics, OSA Handbook of Optics, Volume III, McGraw-Hill, New York (2001). C. C. Miller and Y. Ohno, Luminous Intensity Measurements of Light Emitting Diodes at NIST, Proc. 2nd CIE Expert Symposium on LED Measurement, May 11-12, 2001, Gaithersburg, Maryland, USA, 28-32 (2001). C. C. Miller and Y. Ohno, Luminous Flux Calibration of LEDs at NIST, Proc. 2nd CIE Expert Symposium on LED Measurement, May 11-12, 2001, Gaithersburg, Maryland, USA, 45-48 (2001). F. Manoocheri, S. W. Brown, and Y. Ohno, NIST Colorimetric Calibration Facility for Displays ? Part 2, Society for Information Displays ‘01 DIGEST, 330-333 (2001). Bergman, R. S. and Ohno, Y., "The Art and Science of Lamp Photometry", Proc., Ninth International Symposium on the Science and Technology of Light Sources (LS:9), August 2001, Ithaca, NY (2001). C. C. Miller and Y. Ohno, Luminous Intensity Calibrations and Colorimetry of LEDs at NIST, Proc., Compound Semiconductor Manufacturing Expo, July 2001, Boston, MA,(2001). C. C. Miller and Y. Ohno, Total Luminous Flux Calibrations of LEDs at NIST, Proc., Compound Semiconductor Manufacturing Expo, July 2001, Boston, MA (2001). Y. Ohno, "Color Issues of White LEDs," a section in "Solid State Light Emitting Diodes For General Illumination", OIDA Workshop Preliminary Report, October 26-27, 2000, also in "OLEDs for General Illumination", OIDA Workshop Preliminary Report, Nov 30 - Dec. 1 (2000). Y. Ohno, R. Köhler, and M. Stock, "AC/DC Technique for the Absolute Integrating Sphere Method", Metrologia, 37, 583-586 (2000). Y. Ohno, "CIE Fundamentals for Color Measurements", Proc., IS&T NIP16 International Conference on Digital Printing Technologies, Oct. 15-20, 2000, Vancouver, Canada pp.540-545 (2000). Y. Ohno, "Recent Developments in Detector-Based Photometry and Future Needs in Photometry," Proc. CIE Symposium'99 -75 Years of CIE Photometry, Budapest, 109-114 (1999). Y. Ohno, "Report on the CIE Workshop: Photometry of Flashing Lights," Proc. II, CIE 24th Session Warsaw, 64-67 (1999). Y. Ohno and Y. Zong, "Detector-Based Integrating Sphere Photometry," Proceedings, 24th Session of the CIE Vol. 1, Part 1, 155-160 (1999). Y. Ohno, T. Goodman, and G. Sauter, "Intercomparison of photometric units maintained by NPL (UK), PTB (Germany), and NIST (USA)," J. Res. Natl. Inst. Stand. Technol. 104, 47-57 (1999). C. F. Jones and Y. Ohno, "Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs," Proc., CIE Symposium'99 - 75 Years of CIE Photometry, Budapest, 173-177 (1999). S. Brown, Y. Zong, and Y. Ohno, "Calibrating Colorimeters for Display Measurements," Information Display, 15(12), December 1999, 30-34 (1999). S. Brown and Y. Ohno, "NIST Colorimetric Calibration Facility for Displays," Society for Information Displays 99 DIGEST, 794-797 (1999). S. Brown and Y. Ohno, "NIST Calibration Facility for Display Colorimeters," Proc., IS&T/SPIE 11th International Symposium, Electronic Imaging '99, San Jose (1999). Y. Ohno and S. Brown, "Four-Color Matrix Method for Correction of Tristimulus Colorimeters - Part 2", Proc., IS&T Sixth Color Imaging Conference (1998). Y. Ohno and A. E. Thompson, "Photometry - the CIE V() Function and What Can be Learned from Photometry", Measurements of Optical Radiation Hazards - A Reference Book Based on Presentations Given by Health and Safety Experts on Optical Radiation Hazards, September 1-3, 1998 Gaithersburg, Maryland, ICNIRP 6/98, CIEx016-1998, 445-453 (1998). Ohno, Y., "Detector-based luminous flux calibration using the absolute integrating-sphere method," Metrologia, 35(4), 473-478 (1998). Ohno, Y. and Navarro, N., "New Photometric Calibration Program at the National Institute of Standards and Technology," Metrologia, 35(4), 317-321 (1998). Ohno, Y., "High Illuminance Calibration Facility and Procedures," J. IES 27(2), 132-140 (1998). S. Brown and Y. Ohno, "NIST Reference Spectroradiometer for Color Display Calibrations," Proc., IS&T Sixth Color Imaging Conference, 62-64 (1998). Ohno, Y. and Zong, Y., "Establishment of the NIST flashing-light photometric unit," SPIE Proc. 3140, Photometric Engineering of Sources and Systems, 2-11 (1997). Ohno, Y., Lindemann, M., and Sauter, G., "Analysis of integrating sphere errors for lamps having different angular intensity distributions," J. IES 26(2), 107-114 (1997). Ohno, Y., "Improved Photometric Standards and Calibration Procedures at NIST," J. Res. NIST 102(3), 323-331 (1997). Ohno, Y. and Hardis, J., "Four-color matrix method for correction of tristimulus colorimeters," J. Proc., IS&T Fifth Color Imaging Conference, 301-305 (1997). Ohno, Y. and Navarro, N., "Improved photometric and colorimetric calibrations at NIST," J. Proc. 1997 NCSL Workshop and Symposium, Atlanta, 99-110 (1997). Ohno, Y., Chap. 3 - "Photometric standards" OSA/AIP Handbook of Applied Photometry, 55-99 (1997). Ohno, Y., Chapter 5 - Photometric Measurement Procedures, OSA/AIP Handbook of Applied Photometry, 133-177 (1997). Ohno, Y. and Hardis, J., "Improved matrix method for tristimulus colorimetry of displays," J. Proc., 8th Congress of the Intl. Color Association, AIC Color 97 Kyoto 2, 570-573 (1997). Ohno, Y., NIST Measurement Services: "Photometric Calibrations," NIST SP250-37 (1997). Y. Ohno, "Improved Photometric Standards and Calibration Procedures at NIST," Proceedings of NCSL 1996 Workshop and Symposium, Vol.1, 343-353 (1996). C. Leone, S. Sojourner, E. Vargas, C. Cromer, Y. Ohno, J. Hardis, "Improved Chromaticity and Luminance Measurements Using a Tristimulus Colorimeter," Society for Information Displays 96 DIGEST, 433-436 (1996). Cromer, C.L., Eppeldauer, G.P., Hardis, J.E., Larason, T.C., Ohno, Y., and Parr, A.C., "The NIST Detector-Based Luminous Intensity Scale," J. Res. NIST 101(2), 109-132 (1996). Ohno, Y. and Jackson, J.K., "Characterization of modified FEL quartz-halogen lamps for photometric standards," Metrologia 32(6), 693-696 (1996). Ohno, Y., "Realization of NIST 1995 Luminous Flux Scale Using Integrating Sphere Method," J. Illum. Eng. Soc. of N. Am. 25(1), 13-22 (1996). Ohno, Y. and Sauter, G., "1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany)," J. Res. NIST 100(3), 227-239 (1995). Ohno, Y., "New Method for Realizing Total Flux Scale Using an Integrating Sphere with an external source," J. IES, 24(1), 106-115 (1995). Ohno, Y., "New technologies for optical radiation measurements," CIE 23rd Session Proceedings 498-499 (1995). Ohno, Y., "Realization of NIST Luminous Flux Scale Using an Integrating Sphere with an External Source," Proc. 23rd Session Intl. Comm. on Illum. (CIE); New Delhi, Vol. 1 87-90 (1995). Ohno, Y., "Integrating Sphere Simulation: Application to Total Flux Scale Realization," Appl. Opt. 33(13), 2637-2647 (1994). Ohno, Y., Cromer, C.L., Hardis, J.E., and Eppeldauer, G.P., "The Detector-Based Candela Scale and Related Photometric Calibration Procedures at NIST," J. IESNA 23(1), 88-98 (1994). Ohno, Y., "Silicon Photodiode Self-Calibration Using White Light for Photometric Standards: Theoretical Analysis," Appl. Opt. 31(4), 466 (1992). OTD Home Page   |   Site Comments Online: September 1997   -   Last update: October 2002