Technical Activities

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"Technical Activities 2004" - Table of Contents

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Electron and Optical Physics Division

The strategy for meeting this goal is to improve measurement science and to develop the measurements and standards needed by emerging science and technology-intensive industries.

GOAL: To support
emerging electronic,
optical, and nanoscale
technologies.

Strategic Focus Areas:

   

First

Nanoscale Electronics and Magnetics - to develop techniques for fabricating nanostructures and measuring their electronic and magnetic properties.

Second   

Extreme Ultraviolet Radiation Metrology - the development of metrology for extreme-ultraviolet (EUV) optics, the maintenance of national primary standards for radiometry in the EUV and adjoining spectral regions, and the operation of national user facilities for EUV science and applications.

Third

Coherent Matter-Wave and Quantum Information Processing Metrology - the development of ultracold atom technology, in particular the use of coherent matter waves in sensors, atom interferometers, and quantum information processing devices.

Nanoscale Electronics and Magnetics:

to develop techniques for fabricating nanostructures and measuring their electronic and magnetic properties.

INTENDED OUTCOME AND BACKGROUND

The intended outcome of this work is the continuous improvement of methods for fabricating and characterizing nanometer-scale electronic and magnetic structures, as required to meet current and future needs of the semiconductor and data storage industries. Our main tools for pursuing this program are scanning electron microscopy with polarization analysis (SEMPA) and the scanning tunneling microscope (STM). The Electron Physics Group in the Division has been a leading innovator in both of these methods, which are outgrowths of work begun at NIST in the 1970s.

SEMPA enables us to use conventional scanning electron microscopy (SEM) to image nanometerscale magnetic structure, through spin-polarization analysis of secondary electrons ejected from the sample. It has several unique capabilities that distinguish it from other magnetic imaging techniques: it is a highly sensitive, nonperturbative method, and thus is especially well suited for in situ studies of surface and nanostructure magnetization; it provides a direct measurement of the magnetization of a material region, rather than of a magnetic field; it has the high spatial resolution (about 10 nm), long working distance, and large depth-of-field characteristic of SEM; and it facilitates simultaneous measurements of the magnetization and the topography. SEMPA studies have led to a number of breakthroughs in understanding the basic mechanisms of magnetism on the micro- and nanoscale, and have also addressed near-term measurement issues faced by the magnetic data storage industry.

Our STM program is focused on understanding the electronic and magnetic properties of nanostructures on surfaces. In recent years the STM program has been particularly concerned with the magnetic multilayer materials that have been investigated by SEMPA. The complementarities of SEMPA and STM measurements have elucidated many connections between conditions of layer growth and magnetic device performance.

The main, current direction of the STM program is the course of research made possible by the recently completed Nanoscale Physics Laboratory. This laboratory permits us to measure quantum electronic structures with atomic-scale imaging resolution and high electronenergy resolution. Samples grown in situ can be measured in an ultrahigh vacuum environment with magnetic fields of up to 10 T at temperatures down to 2.3 K. Additionally, a program in Autonomous Atom Assembly is underway that will allow us to fabricate highly complex and perfect nanostructures on demand.

Accomplishments

  • Understanding Single Atom Manipulation

      Figure 1

    Figure 1. Binding site image for a cobalt atom on a copper (111) surface, showing three-fold symmetry.

    A low-temperature STM can move atoms about on clean, flat surfaces. However, our limited understanding of the interactions involved restricts our ability to make complex nanostructures.

    We recently studied the atom dynamics that occur during atom manipulation— important if we are to make real nanodevices on technological substrates. We found that the atoms at the end of an iridium STM tip create a potential trap sufficient to capture a cobalt atom adsorbed on a clean copper crystal and to limit its lateral motion to less than 0.2 nm. We also discovered that the vibrational level of the cobalt-copper bond could be varied dramatically by changing the electron current tunneling into the cobalt atom.

    By adjusting the proximity of the STM tip to the cobalt atom, as well as the current flowing through it, it is possible to translate the cobalt atom across the copper crystal surface in a controlled and well-understood manner. It is even possible to force the cobalt atom into what is normally not a binding site on the surface. As the conditions necessary for forcing the atom into a nonbinding site are approached, the atom begins to jump back and forth between the nonbinding site and a neighboring binding site, giving rise to audio frequency noise in the tunneling current. This noise can be monitored in the laboratory and correlates with the locations of the nonbinding sites on the surface.

    Using our newly acquired understanding of the atom manipulation process, we were able to: obtain a direct observation of a characterizable random two-state fluctuator, demonstrate the ability to modify single atom surface dynamics, show how chemical binding sites can be modified to change unstable ones to stable and vice versa, provide the first explanation for the origin of excess tunneling noise, and present a new type of STM image that reveals the surface binding sites of the crystal. (See Fig. 1.)

    This work is an example of a new class of measurements referred to as "Atom-Based Metrology," where a single atom probes its local environment while nanoscale techniques position it within that environment. Here, the probe is the cobalt atom and the STM tip moves it across the copper surface. The atom responds to the surface potentials through its lateral motion, which is reflected in the measured tunneling current. This allows measurement of the binding site map of the copper surface through observation of the dynamical response of a single scanned atom to its environment. We are planning additional experiments using atombased metrology.


    CONTACT: Dr. Joseph A. Stroscio
    (301) 975-3716
    joseph.stroscio@nist.gov



  • Geometrically Constrained Magnetic Nanostructures

        Figure 2

    Figure 2. SEM image of a silicon nanopillar, along with a SEMPA image of the epitaxial, cobalt thin-film disk at the top of the pillar. The SEMPA measurement shows a geometrically constrained domain wall whose width varies with radial distance.

    Small, patterned, magnetic thin-film structures play a critical role in emerging magnetoelectronic technologies, which range from nonvolatile random access memories to magnetic field sensors. One potential advantage of miniaturizing these devices is that the size and geometry of the patterned structure may be used to shape the internal magnetic nanostructure and thus control the device operation. Imaging this internal nanostructure is a measurement challenge, since the structures consist of only a small amount of magnetic material and can easily be perturbed by conventional magnetic imaging methods such as Magnetic Force Microscopy (MFM).

    In collaboration with the University of Cambridge Thin-Film Magnetism Group we have used our SEMPA facility to noninvasively image the magnetic nanostructure of epitaxially grown thinfilm Co disks. Isolated, micrometer-sized Co disks were grown by depositing a several-nanometer-thick Co film onto a Si substrate with etched circular pillars. Unlike bulk Co, these epitaxially grown Co thin films have a cubic crystal structure that leads to a four-quadrant, closed-flux domain structure, characteristic of a film with cubic anisotropy.

    The SEMPA images (e.g., Fig. 2) showed how the internal magnetic nanostructure of these disks depends critically on the size and shape of the element. Magnetic domain wall widths, for example, do not depend on sample geometry in bulk ferromagnets. But in these structures the domain walls are geometrically constrained by the significant shape-related magnetostatic energies, and the wall widths vary dramatically with radial distance from the magnetic vortex core.


    CONTACT: Dr. John Unguris
    (301) 975-3712
    john.unguris@nist.gov



  • Imaging Magnetic Sensors

  •   Figure 3

    Figure 3. SEMPA image of a zigzag magnetic sensor element, compared with the OOMMF micromagnetics simulation. Line scans through the centers of the elements show the magnitude of the magnetic oscillations.

    Recent advances in thin-film and multilayer magnetism offer the exciting possibility of creating a new generation of magnetic sensors that are small, inexpensive, and as sensitive as currently used, more cumbersome sensors such as SQUIDs. Development of this new generation of sensors requires understanding and control of the magnetic nano-structure, in order to enhance sensitivity and eliminate potential sources of magnetic noise.

    We are working with NIST magnetics groups in EEEL, MSEL, and ITL to test and measure possible new materials and devices for use as sensors. One potentially useful device is a zigzag-shaped magnetic sensor developed by EEEL. The device’s magnetic sensitivity is based on anisotropic magnetoresistance (AMR), and therefore requires the magnetization to be tilted with respect to the current passing through the device. In the zigzag sensor, the shape anisotropy forces the magnetization to tilt relative to the current.

    We have used SEMPA to measure how well various zigzag geometries accomplish this angular biasing and to look for potential sources of magnetic noise. (See Fig. 3.) SEMPA imaging is especially useful since it not only images the magnetization directly, it provides quantitative measurement of magnetization directions that can be compared to the results of micromagnetic calculations. The SEMPA images also reveal potential magnetic trouble spots such as trapped magnetic singularities, which can interfere with reproducible magnetic response, as well as defects that can produce magnetization-related noise. Work is currently underway to allow imaging of electrically active magnetic sensors, which will allow a better understanding of noise sources and failure modes in real devices.


    CONTACT: Dr. John Unguris
    (301) 975-3712
    john.unguris@nist.gov


  • Current Induced Magnetic Switching

      Figure 4 Figure 4. Electron diffusing near a ferromagnetic interface. The spin of the electron diffusing in the copper has its direction changed when it scatters from a cobalt interface with an in-plane spin wave.

    In a magnetic multilayer, changing the relative orientation of the magnetizations of two layers changes the current flowing through the multilayer. This effect, called giant magnetoresistance, is used in magnetic sensors, magnetic random access memory (MRAM), and read heads in magnetic disk drives. An inverse effect, where the current changes the magnetic configuration, is being studied for possible applications. In this case, a current passing through a multilayer exerts a torque on the magnetizations of different layers causing the magnetizations to rotate.

    Large enough currents passing through such multilayers can switch the magnetizations of the layers between parallel and antiparallel, or cause one to rapidly precess around the other layer. If the size of the current necessary to reverse magnetizations can be reduced sufficiently, spin-transfer torques could provide a way to switch bits in MRAM. In other devices, it should be possible to make current-controlled oscillators.

    We have developed quantitative models for these spin-transfer torques to help the development of devices based on this effect. (See Fig. 4.) In particular, we recently developed an analytic formula for the torque as a function of the device geometry and the magnetic configuration. Such a formula will allow rapid simulation of prototypes for device optimization.

    We have also shown how spin-transfer torques can cause a magnetic instability even with a single ferromagnetic layer. This effect was first seen in point-contact experiments and later in more device-like, lithographically fabricated nanopillars. We explained how in-plane inhomogeneities in the magnetization lead to the observed instabilities. We are presently studying the effect of these inhomogeneities on more typical device geometries.


    CONTACT: Dr. Mark D. Stiles
    (301) 975-3745
    mark.stiles@nist.gov



  • End States in One-Dimensional Chains

      Figure 5

    Figure 5. STM images of one-dimensional atom chains on Silicon, showing empty states (upper panel) and filled states (lower panel). End states cause the chains to appear shorter in the upper panel.

    The abilities to fabricate structures on the nanoscale and to measure their electronic properties present the opportunity to discover new phenomena. We have observed a new kind of electronic state at the ends of a one-dimensional nanostructure. This "end state" is a direct consequence of the lower dimensionality of the structure. Such end states can be thought of as zero-dimensional analogs to two-dimensional states that occur at the surface of a crystal.

    In fabricating these structures, we exploit the self-assembly of atom chains that occurs when we deposit gold on stepped silicon surfaces at elevated temperatures. Rows of atom chains of varying length can be seen in the STM images of Fig. 5, which are of the same area but measured at opposite polarity. The chains in the upper panel, measured at a sample potential of +0.5 V, appear shorter than the chains in the lower panel, measured at a sample potential of -1.0 V, as emphasized by the white box around a seven-atom chain. Such a polarity contrast in STM suggests an underlying difference in the density of states for the empty and filled states near the ends of the chains, indicating the presence of end states.

    To characterize this new kind of electronic state, we made spatially resolved scanning tunneling spectroscopy measurements along finite chains to map the density of states. These measurements reveal quantized states that form in isolated chain segments. Furthermore, a transfer of spectral weight from the filled to the empty states over the atoms at the ends of the chains is directly attributable to the formation of end states.

    These end states cannot be described by a simple particle-in-a-box model for states along the chains. A comparison to a tight-binding model demonstrates how the formation of end electronic states transforms the density of states and the quantized levels within the chains. The end states effectively lower the energy levels of the filled states within the chains, suggesting a possible driving force for their formation. As a further confirmation of the tight-binding model and the end electronic effects, we calculated STM topography profiles at positive and negative biases and reproduced the experimentally observed contrast at the end atoms in Fig. 5.


    CONTACT: Dr. Daniel T. Pierce
    (301) 975-3711
    daniel.pierce@nist.gov


First strategic focus   |   Second strategic focus   |   Third strategic focus

"Technical Activities 2004" - Table of Contents