Return to the search form Results for: allen (author) + 1991-present : Optical Technology Allen, D.W., Saunders, R.D., and Yoon, H.W., Methods to reduce the size-of-source effect in radiometers, Metrologia 42, 89-96 (2005). Allen, D.W., Brown, S.W., Eppeldauer, G.P., Gibson, C.E., Litorja, M., Lykke, K.R., Saunders, R.D., and Yoon, H.W., Temperature determinations of the Ag and Au-freezing points using a detector-based radiation thermometer, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 113-118. Allen, D.W., Brown, S.W., Eppeldauer, G.P., Gibson, C.E., Litorja, M., Lykke, K.R., Saunders, R.D., and Yoon, H.W., The realization and the dissemination of the detector-based kelvin, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 57-70. Allen, D.W., Dezsi, G., and Yoon, H.W., Portable LED-illuminated radiance source, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 817-822. Allen, D.W., Eppeldauer, G.P., Gibson, C.E., and Yoon, H.W., Comparison of the NIST radiance temperature scale with the detector-based radiance temperature scale from 1200 K to 2800 K, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 127-132. Allen, D.W., Gibson, C.E., Lowe, D., Machin, G., and Yoon, H.W., A comparison of ITS-90 and a detector-based scale between NPL and NIST using metal-carbon eutectics, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 1057-1062. Allen, D.W., Saunders, R.D., and Yoon, H.W., Methods to reduce the size-of-source effect in radiation thermometers, in Proc. 9th Intl. Sym. on Temp. and Thermal Measurements in Industry and Science (TEMPMEKO’04, Dubrovnik, Croatia, June 2004), p. 512-526. Brewer, S.H., Allen, A.M., Lappi, S.E., Chasse, T.L., Briggman, K.A., Gorman, C.B., and Franzen, S., Infrared Detection of a Phenylboronic Acid Terminated Alkane Thiol Monolayer on Gold Surfaces, Langmuir 20, 5512-5520 (2004). Allen, D.W., Eppeldauer, G.P., Brown, S.W., Early, E.A., Johnson, B.C., and Lykke, K.R., Characterization and Calibration of a Trap Detector Filter Radiometer, Proc. SPIE 2003 5151, 471-479 (2003). Allen, D.W., Saunders, R.D., Johnson, B.C., Gibson, C.E., and Yoon, H.W. The Development and the Characterization of an Absolute Pyrometer Calibrated for Spectral Radiance Responsivity, Proc. 8th Temperature Symposium 577-582 (2003). Yoon, H.W., Allen, D.W., Gibson, C.E., Saunders, R.D., Johnson, B.C., Brown, S.W., and Lykke, K.R., Temperature Scales using Radiation Thermometers Calibrated using Absolute Irradiance and Radiance Responsivity, in Proc. of NCSL 2003, Tampa, FL, published on CD only (2003). Allen, D., Early, E.A., Hanssen, L.M., Kaplan, S.G., and Nadal M.E., Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers, Metrologia 39, 157-164 (2002). Kaplan, S.G., Hanssen, L.M., Early, E.A., Nadal, M.E., Allen, D., Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers, Metrologia 39, 157-164 (2002). Early, E.A., Bush, B.C., Brown, S.W., Allen, D.W., and Johnson, B.C., Radiometric Calibration of the Scripps Earth Polychromatic Imaging Camera, in Earth Observing Systems VI, ed. by W.L. Barnes, Proc. SPIE 4483 (Bellingham, Washington: Soc. Photo-Optical Instrumentation Engineers, 2001). Kreider, K.G., Allen, D.W., Chen, D.H., DeWitt, D.P., Meyer, C.W., and Tsai, B.K., Effects of Wafer Emissivity on Lightpipe Radiometry in RTP Tools, 9th Intl. Conf. Advanced Thermal Processing of Semiconductors (2001), p. 163-168. Meyers, C.W., Allen, D.W., DeWitt, D.P., Kreider, K.G., Lovas, F.J., and Tsai, B.K., ITS-90 Calibration of Radiometers Using Wire/Thin-Film Thermocouples in the NIST RTP Tool: Experimental Procedures and Results, 7th International Conference on Advanced Thermal Processing of Semiconductors, Colorado Springs, CO Thermal (1999), 136-141. Tsai, B.K., DeWitt, D.P., Lovas, F.J., Kreider, K.G., Meyer, C.W., and Allen, D.W., Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, in Proc. 7th Intl. Symp. on Temp. and Thermal Meas. in Industry and Science (TEMPMEKO '99), ed. by J.F. Dubbeldam and M.J. de Groot (Delft, The Netherlands, 1999), p. 726-731. Kreider, K.G., DeWitt, D.P., Tsai, B.K., Lovas, F.J., and Allen, D.W., Calibration Wafer for Temperature Measurement in RTP Tools, in Intl. Conference: Characterization and Metrology for ULSI Technology, Gaithersburg, MD (1998), p. 303-309. Kreider, K.G., DeWitt, D.P., Tsai, B.K., Lovas, F.J., and Allen, D.W., RTP Calibration Wafer Using Thin-Film Thermocouples, in Rapid Thermal and Integrated Processing VII, ed. by M.C. Ozturk, F. Roozeboom, P.J. Timans, and S.H. Pas, Mat. Res. Soc. Symp. Proc. 525 (1998), p. 87. Tsai, B.K., Lovas, F.J., DeWitt, D.P., Kreider, K.G., Burns, G.W., and Allen, D.W., In-Chamber Thermometry Calibration using a Silicon Proof-Wafer, in Proc. 5th International Conference of Advanced Thermal Processing of Semiconductors: RTP'97, 340-346 (1997). You got 20 matches Return to the search form